F. Vangaever: search on Z-Library

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1

Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale

Yannick Vercammen, Roel De Mondt, Jaymes Van Luppen, Frank Vangaever, Luc Van Vaeck

Journal:

Analytical and Bioanalytical Chemistry

Year:

2010

Language:

english

File:

PDF, 602 KB

english, 2010

2

Computational Fluid Dynamics-Based Study of a High Emissivity Coil Coating in an Industrial Steam Cracker

Vangaever, Stijn, Reyniers, Pieter A, Visser, Cor, Jakobi, Dietlinde, Heynderickx, Geraldine J., Marin, Guy B, Van Geem, Kevin Marcel

Journal:

Industrial & Engineering Chemistry Research

Year:

2018

Language:

english

File:

PDF, 1.44 MB

english, 2018

3

Ultra-low-angle microtomy to back up S-SIMS molecular depth profiling with C60+ and Bin+ for the nanoscale analysis of high-tech industrial materials

R. De Mondt, Y. Vercammen, R. Dardenne, F. Vangaever, J. Van Luppen, L. Van Vaeck

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 324 KB

english, 2011

4

Pyrometer-based control of a steam cracking furnace

Vangaever, Stijn, Reyniers, Pieter A., Symoens, Steffen H., Ristic, Nenad D., Djokic, Marko R., Van Geem, Kevin M., Marin, Guy B.

Journal:

Chemical Engineering Research and Design

Year:

2019

Language:

english

File:

PDF, 4.66 MB

english, 2019

5

Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques

L. Adriaensen, F. Vangaever, J. Lenaerts, R. Gijbels

Journal:

Journal of Mass Spectrometry

Year:

2005

Language:

english

File:

PDF, 363 KB

english, 2005

6

Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition

L. Adriaensen, F. Vangaever, R. Gijbels

Journal:

Applied Surface Science

Year:

2004

Language:

english

File:

PDF, 166 KB

english, 2004

7

Metal-Assisted Secondary Ion Mass Spectrometry: Influence of Ag and Au Deposition on Molecular Ion Yields

Adriaensen, L., Vangaever, F., Gijbels, R.

Journal:

Analytical Chemistry

Year:

2004

Language:

english

File:

PDF, 773 KB

english, 2004

8

Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions

Roel De Mondt, Luc Van Vaeck, Andreas Heile, Heinrich F. Arlinghaus, Nicolas Nieuwjaer, Arnaud Delcorte, Patrick Bertrand, Jens Lenaerts, Frank Vangaever

Journal:

Rapid Communications in Mass Spectrometry

Year:

2008

Language:

english

File:

PDF, 373 KB

english, 2008

9

A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques

L. Adriaensen, F. Vangaever, R. Gijbels

Journal:

Applied Surface Science

Year:

2004

Language:

english

File:

PDF, 102 KB

english, 2004

10

S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings

L. Adriaensen, F. Vangaever, J. Lenaerts, R. Gijbels

Journal:

Applied Surface Science

Year:

2006

Language:

english

File:

PDF, 317 KB

english, 2006

11

Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films

L. Adriaensen, F. Vangaever, J. Lenaerts, R. Gijbels

Journal:

Rapid Communications in Mass Spectrometry

Year:

2005

Language:

english

File:

PDF, 267 KB

english, 2005

12

The isobutane chemical ionization mass spectra of 2-methyl substituted 1,3-cycloalkanediol diacetates and dimethyl ethers

L. Dhaenens, C. C. Van De Sande, F. Vangaever

Journal:

Journal of Mass Spectrometry

Year:

1979

Language:

english

File:

PDF, 350 KB

english, 1979

13

Influence of the vacuum on the separation efficiency in coupled (GC)2-MS

F. Vangaever, P. Sandra, M. Verzele

Journal:

Chromatographia

Year:

1979

Language:

english

File:

PDF, 152 KB

english, 1979

14

Laser Microprobe with Fourier Transform Ion Cyclotron Resonance Mass Spectrometer for Surface Analysis

Moisio, Harri, Vaeck, Luc Van, Vangaever, Frank

Journal:

Analytical Chemistry

Year:

2007

Language:

english

File:

PDF, 251 KB

english, 2007

15

Polar organic fraction of air particulate matter

E. Wauters, F. Vangaever, P. Sandra, M. Verzele

Journal:

Journal of Chromatography A

Year:

1979

Language:

english

File:

PDF, 695 KB

english, 1979

16

TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology

Roel De Mondt, Luc Van Vaeck, Andreas Heile, Heinrich F. Arlinghaus, Frank Vangaever, Jens Lenaerts

Journal:

Analytical and Bioanalytical Chemistry

Year:

2009

Language:

english

File:

PDF, 487 KB

english, 2009

17

Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)

R. De Mondt, L. Adriaensen, F. Vangaever, J. Lenaerts, L. Van Vaeck, R. Gijbels

Journal:

Applied Surface Science

Year:

2006

Language:

english

File:

PDF, 216 KB

english, 2006

18

Determination of carbon in electroplated gold layers by deuteron activation analysis

C. Vandecasteele, J. Dewaele, J. Hoste, R. De Doncker, F. Vangaever, J. Vanhumbeek

Journal:

Journal of Radioanalytical and Nuclear Chemistry

Year:

1985

Language:

english

File:

PDF, 275 KB

english, 1985

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